15

Back Matter

Year:
1991
Language:
english
File:
PDF, 39 KB
english, 1991
38

Scanning Probe Microscopy || Kelvin Probe Force Microscopy of Semiconductors

Year:
2007
Language:
english
File:
PDF, 1.14 MB
english, 2007
43

Ferroelectrics: Negative capacitance detected

Year:
2015
Language:
english
File:
PDF, 321 KB
english, 2015